A. 주요사양
- B1506A common features
: Wide operation range up to 3 kV/1500 A
: Fully automated fast thermal test from -50 °C to +250 °C
: Automatic power device (semiconductor and component) datasheet creation
: Auto record function to prevent data loss
- B1506A IV package features
: Fully automated fast IV measurement (Ron, BV, Leakage, Vth, Vsat, etc) for both
package and on-wafer devices
: Narrow IV pulse widths (down to 10 μs) to prevent device self-heating for revealing : actual device performance
: Oscilloscope view (Time-domain view) to monitor actual voltage/current pulsed
waveforms for accurate measurement
: Scalable configuration to add CV and Qg, to expand current range from 20A to 500 A,
1500 A
- B1506A full package features
: All of the IV package features
: Measure transistor input, output and reverse transfer capacitances (Ciss, Coss, Crss,
Cies, Coes, Cres) and gate resistance (Rg) at 3kV for package devices
: Gate charge (Qg) curve measurement for package devices
: Power loss (conduction, driving and switching loss) calculatio
B. 제품 관련 자료
(매뉴얼) B1506A Power Device Analyzer for Circuit Design | 다운 |
(제품사양서) B1506A Power Device Analyzer for Circuit Design | 다운 |