B1506A 전류/전압 커브 트레이서

A. 주요사양

– B1506A common features

: Wide operation range up to 3 kV/1500 A

: Fully automated fast thermal test from -50 °C to +250 °C

: Automatic power device (semiconductor and component) datasheet creation

: Auto record function to prevent data loss

– B1506A IV package features

: Fully automated fast IV measurement (Ron, BV, Leakage, Vth, Vsat, etc) for both

package and on-wafer devices

: Narrow IV pulse widths (down to 10 μs) to prevent device self-heating for revealing : actual device performance

: Oscilloscope view (Time-domain view) to monitor actual voltage/current pulsed

waveforms for accurate measurement

: Scalable configuration to add CV and Qg, to expand current range from 20A to 500 A,

1500 A

– B1506A full package features

: All of the IV package features

: Measure transistor input, output and reverse transfer capacitances (Ciss, Coss, Crss,

Cies, Coes, Cres) and gate resistance (Rg) at 3kV for package devices

: Gate charge (Qg) curve measurement for package devices

: Power loss (conduction, driving and switching loss) calculatio

C. 제품 관련 자료

(매뉴얼) B1506A Power Device Analyzer for Circuit Design 다운
(제품사양서) B1506A Power Device Analyzer for Circuit Design 다운